| Record ID | ia:isbn_0892527005_665 |
| Source | Internet Archive |
| Download MARC XML | https://archive.org/download/isbn_0892527005_665/isbn_0892527005_665_marc.xml |
| Download MARC binary | https://www.archive.org/download/isbn_0892527005_665/isbn_0892527005_665_meta.mrc |
LEADER: 00988nam a2200241 a 4500
001 86061832
003 DLC
005 19870912000000.0
008 870904s1986 waua b 10100 eng
010 $a 86061832
020 $a0892527005 (pbk.)
050 0 $aTS156.2$b.O66 1986
082 0 $a681/.4$219
245 00 $aOptical techniques for industrial inspection, 4-6 June 1986, Québec City, Canada /$cPaolo G. Cielo, chair/editor.
260 0 $aBellingham, Wash. :$bSPIE--the International Society for Optical Engineering,$cc1986.
300 $avi, 376 p. :$bill. ;$c28 cm.
440 0 $aProceedings of SPIE--the International Society for Optical Engineering ;$vv. 665
500 $aSponsored by National Research Council Canada ... [et al.]
504 $aIncludes bibliographies and index.
650 0 $aQuality control$xOptical methods$xCongresses.
700 10 $aCielo, Paolo G.
710 20 $aSociety of Photo-optical Instrumentation Engineers.
710 20 $aNational Research Council Canada.