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LEADER: 10013cam a2200349Ia 4500
001 4184350
005 20221027051458.0
008 030703t20032003waua b 101 0 eng d
020 $a0819447285
035 $a(OCoLC)ocm52547060
035 $a(NNC)4184350
035 $a4184350
040 $aLHL$cLHL$dOrLoB-B
090 $aQC427.8.S64$bS63 2003
245 00 $aSpeckle metrology 2003 :$bproceedings : 18-20 June, 2003, Trondheim, Norway /$ceditors, Kay Gastinger, Ole Johan Løkberg, Svein Winther ; sponsored and published by SINTEF (Norway), NTNU--Norwegian University of Science and Technology (Norway) ; cooperating organizations, SPIE--the International Society for Optical Engineering, EOS--European Optical Society.
260 $aBellingham, Wash. :$bSPIE,$c[2003], ©2003.
300 $aix, 390 pages :$billustrations ;$c28 cm.
336 $atext$btxt$2rdacontent
337 $aunmediated$bn$2rdamedia
490 1 $aSPIE proceedings series ;$vv. 4933
504 $aIncludes bibliographical references and author index.
505 00 $tFundamentals and applications of speckle /$rI. Yamaguchi -- $tNoise reduction in speckle pattern interferometry /$rJ. Kauffmann, M. Gahr and H. J. Tiziani -- $tDeformation analysis of curved surfaces in holographic interferometry with similar remarks concerning nonspherical gravitational fields /$rW. Schumann -- $tSampled speckles and applications /$rA. K. Asundi -- $tSpeckle correlation methods applied to ballistics and explosives /$rS. G. Grantham and J. E. Field -- $tSpeckle correlation used for measuring microstructural changes in paper /$rM. Sjodahl and L. Larsson -- $tMonte Carlo method in digital holography /$rZs. Papp, J. Kornis and B. Gombkoto -- $tDigital complex holography using a shearing interferometer: improvements and recent results /$rA. Albertazzi, Jr. and A. Vieira Fantin -- $tUbiquitous coherence: boon and bale of the optical metrologist /$rG. Hausler -- $tLow-coherence ESPI in the investigation of ancient terracotta warriors /$rG. Gulker, K. D. Hinsch and A. Kraft -- $tLow-coherence speckle interferometer (LCSI) for characterisation of adhesion in adhesive-bonded joints /$rK. Gastinger, S. Winther and K. D. Hinsch -- $tMeasurement of the mechanical amplitude and phase of transient surface acoustic waves using double-pulsed TV holography and the spatial Fourier transform method /$rC. Trillo, A. F. Doval, D. Cernadas, O. Lopez, C. Lopez, B. V. Dorrio, J. L. Fernandez and M. Perez-Amor -- $tSpeckle interferometry by partial coherent beam /$rH. Tajalli, M. Sahrai and D. Jafari -- $tPhase-shifting digital speckle pattern interferometry: off-the-shell setup description and application to stainless steel membrane displacement measurements /$rP. R. Slangen and B. Gautier -- $tFringe compensation in multiband speckle shearography using a wedge prism /$rC. Falldorf, S. G. Hanson, W. Osten and W. Juptner -- $tSimplified time-averaged digital interferometry for vibration studies of microelements /$rK. Patorski, A. Jozwicko, A. Kalinowski and M. Pawlowski -- $tActive metrology by digital holography /$rW. Osten -- $tLensless zooming Fourier transform digital holography /$rA. F. Doval, C. Trillo, O. Lopez, D. Cernadas, C. Lopez, B. V. Dorrio, J. L. Fernandez and M. Perez-Amor -- $tPromise and challenge of DUV speckle interferometry /$rP. Aswendt -- $tPulsed endoscopic digital holographic interferometry for investigation of hidden surfaces /$rG. Pedrini, I. Alexeenko and H. J. Tiziani -- $tShape measurement by endoscopic electronic-speckle-pattern interferometry with a two-wavelength method /$rB. Kemper, J. Kandulla, S. Knoche and G. von Bally -- $tMulticomponent shearography employing four measurement channels /$rR. M. Groves, S. W. James and R. P. Tatam -- $tResidual stress investigations in composite samples by speckle interferometry and specimen repositioning /$rA. Baldi and P. Jacquot -- $tComparative analysis of digital and optical speckle displacement techniques for study of in-plane surface strains /$rL. I. Muravsky, O. P. Maksymenko and O. M. Sakharuk -- $tEssential features of residual stresses determination in thin-walled plane-structures in a base of whole field interferometric measurements /$rV. S. Pisarev, I. Odintsev, V. Balalov and A. Apalkov -- $tSpeckle correlation of changing surfaces /$rM. F. Ruiz Gale, E. N. Hogert and N. G. Gaggioli -- $tFringe analysis today and tomorrow /$rJ. M. Huntley -- $tPhase singularities in dynamic speckle fields and their applications to optical metrology /$rW. Wang, N. Ishii, Y. Miyamoto and M. Takeda -- $tA two-bucket phase-stepped shearing speckle interferometer: Why does it work? /$rP. A. A. M. Somers, H. van Brug and J. J. M. Braat -- $tHilbert transform method for analysis of ESPI for the study of dynamic events /$rV. Madjarova, H. Kadono and S. Toyooka -- $tVisualization of yielding phenomena on carbon steel under tensile loading by speckle pattern interferometry /$rK. Gomi, Y. Funamoto, S. Yoshida, A. Gaviria, K. Ichinose and K. Taniuchi -- $tPhase retrieval in digital speckle pattern interferometry using a chirped Gaussian wavelet transform and a smoothed time-frequency distribution /$rA. Federico and G. H. Kaufmann -- $tImprovement of interferometric phase measurements by consideration of the speckle field topology /$rE. Kolenovic, W. Osten and W. Jupter -- $tApplication of artificial neural network in holographic and speckle interferometry /$rJ. Kornis and G. Vasarhelyi -- $tDetection of faults in interferometric fringe patterns by optical wavelet filtering /$rG. K. Wernicke, F. Kallmeyer, S. Krueger, H. Gruber and D. Kayser -- $tEvaluation of residual stress in MEMS structures by digital holography /$rG. Coppola, S. De Nicola, P. Ferraro, A. Finizio, S. Grilli, M. Iodice, C. Magro and G. Pierattini -- $tA decade of innovation with laser speckle metrology /$rA. Ettemeyer -- $tHolographic optical elements for combined holographic and digital speckle pattern interferometry /$rS. R. Guntaka, B. Bowe, V. Toal and S. Martin -- $tHandheld ESPI-speckle interferometer /$rR. S. Hansen -- $tDynamic holographic interferometry with photorefractive crystals: review of applications and advanced techniques /$rM. P. Georges, C. Thizy, V. Scauflaire, S. Ryhon, G. Pauliat, P. Lemaire and G. Roosen -- $tCharacteristics of imaging fibre bundles for use in an ESPI-based instrument for distributed high-resolution measurements /$rE. K. Hack, P. Dias-Lalcaca and U. J. Sennhauser -- $tSpeckle techniques for pavement surface analysis /$rC. Hun, J.-M. Caussignac and M. M. Bruynooghe -- $tReal-time color holographic interferometry devoted to 2D unsteady wake flows /$rJ.-M. Desse, F. Albe and J.-L. Tribillon -- $tSpeckle interferometry application for erosion measurements in fusion devices /$rE. Gauthier and R. Roupillard -- $tDigital image plane holography as a three-dimensional flow velocimetry technique /$rJ. Lobera, N. Andres and M. P. Arroyo -- $tLaser ignition of premixed gases studied by pulsed TV holography /$rR. Mattsson, P. Gren and A. Wahlin -- $tObject-adapted inverse pattern projection: generation, evaluation and applications /$rT. Bothe, W. Li, C. von Kopylow and W. Juptner -- $tRecent advances in temporal phase-shifting speckle interferometry /$rP. D. Ruiz, J. M. Huntley and G. H. Kaufmann -- $tHybrid phase unwrapping algorithm extended by a minimum-cost-matching strategy /$rR. S. Schone and O. Schwarz -- $tHoloVision: a software package for reconstruction and analysis of digitally sampled holograms /$rO. Skotheim -- $tDesign and calibration of a low-cost open-loop PZT actuator for phase-shifting speckle interferometry /$rL. Bruno, P. Mainieri and A. Poggialini -- $tNew automatic FFT filtration method for phase maps and its application in speckle interferometry /$rA. Shulev, I. Russev and V. Sainov -- $tA valuable method for online wire quality control: light scattering from cylindrical rough surfaces /$rF. Perez Quintian, M. A. Rebollo, R. G. Berlasso and N. G. Gaggioli -- $tMicroscopic ESPI: better fringe quality by the Fourier transform method /$rA. El Jarad, G. Gulker and K. D. Hinsch -- $tTube junction study by electronic speckle pattern interferometry /$rA. Moreno Yeras -- $tMechanical measurement using multiplexing/demultiplexing of digital Fresnel holograms /$rP. Picart, E. Moisson and D. Mounier -- $tMonitoring the influence of environmental conditions on the growth of plants using statistical interferometry /$rH. Kadono, T. Nakamura, K. Matsui and S. Toyooka -- $tMeasurement of deformation of paper subjected to tensile loads using electronic speckle pattern interferometry /$rE. Umezaki, J. Takakuwa and K. Futase -- $tInvestigation of three interferometric techniques for detection of surface flaws in elastomers /$rE. M. Mihaylova, A. Tabakovic, S. Martin and V. Toal -- $tPartially coherent beam propagation /$rH. Tajalli and M. Sahrai -- $tApplications of speckle interferometry to civil engineering in Cuba /$rR. Gonzalez-Pena, R. M. Cibrian-Ortiz de Anda and L. M. Lopez -- $tEdge detection in the presence of speckle noise in barcode scanning systems /$rE. Marom and S. Kresic-Juric.
650 0 $aSpeckle metrology$vCongresses.
700 1 $aGastinger, Kay.$0http://id.loc.gov/authorities/names/no2003102623
700 1 $aLøkberg, Ole Johan.$0http://id.loc.gov/authorities/names/no2010003119
700 1 $aWinther, Svein.$0http://id.loc.gov/authorities/names/no2003127598
710 2 $aSINTEF-gruppen (Norway)$0http://id.loc.gov/authorities/names/no89020318
710 2 $aNorges teknisk-naturvitenskapelige universitet.$0http://id.loc.gov/authorities/names/n97022361
710 2 $aSociety of Photo-optical Instrumentation Engineers.$0http://id.loc.gov/authorities/names/n78088934
710 2 $aEuropean Optical Society.$0http://id.loc.gov/authorities/names/n92062713
830 0 $aProceedings of SPIE--the International Society for Optical Engineering ;$vv. 4933.$0http://id.loc.gov/authorities/names/n42030541
852 00 $boff,eng$hQC427.8.S64$iS63 2003g