| Record ID | ia:isbn_0819428728_3418 |
| Source | Internet Archive |
| Download MARC XML | https://archive.org/download/isbn_0819428728_3418/isbn_0819428728_3418_marc.xml |
| Download MARC binary | https://www.archive.org/download/isbn_0819428728_3418/isbn_0819428728_3418_meta.mrc |
LEADER: 01381cam a22002894a 4500
001 00501359
003 DLC
005 20001101070237.0
008 000323s1998 waua b 101 0 eng
010 $a 00501359
020 $a0819428728
040 $aDLC$cDLC$dDLC
042 $apcc
050 00 $aTA418.62$b.A38 1998
082 00 $a620.1/1295$221
245 00 $aAdvances in optical beam characterization and measurements :$b14 July 1998, Québec, Canada /$cMichel Piché, chair/editor ; sponsored by SPIE--the International Society for Optical Engineering ; cosponsored by Government of Canada ; cooperating organizations, Canadian Association of Physicists, Defence Research Establishment of Valcartier (Canada).
260 $aBellingham, Wash. :$bSPIE,$cc1998.
300 $av, 128 p. :$bill. ;$c28 cm.
490 1 $aProceedings / SPIE--the International Society for Optical Engineering ;$vv. 3418
504 $aIncludes bibliographical references and index.
650 0 $aMaterials$xOptical properties$vCongresses.
650 0 $aLaser beams$xMeasurement$vCongresses.
700 1 $aPiché, Michel.
710 2 $aSociety of Photo-optical Instrumentation Engineers.
710 2 $aCanadian Association of Physicists.
710 2 $aDefence Research Establishment Valcartier (Québec)
830 0 $aProceedings of SPIE--the International Society for Optical Engineering ;$vv. 3418.