| Record ID | ia:environmentalpro0000unse_t4e1 |
| Source | Internet Archive |
| Download MARC XML | https://archive.org/download/environmentalpro0000unse_t4e1/environmentalpro0000unse_t4e1_marc.xml |
| Download MARC binary | https://www.archive.org/download/environmentalpro0000unse_t4e1/environmentalpro0000unse_t4e1_meta.mrc |
LEADER: 01140nam a2200265 a 4500
001 92080039
003 DLC
005 19940602171920.2
008 920316s1992 waua b 101 0 eng
010 $a 92080039
020 $a0819407836
040 $aDLC$cDLC
050 00 $aTD193$b.E543 1992
082 00 $a628.5/028/7$220
245 00 $aEnvironmental and process monitoring technologies :$b20-22 January 1992, Los Angeles, California /$cTuan Vo-Dinh, chair/editor ; sponsored and published by SPIE--the International Society for Optical Engineering.
260 $aBellingham, Wash. :$bThe Society,$cc1992.
300 $aix, 292 p. :$bill. ;$c28 cm.
490 1 $aProceedings / SPIE--the International Society for Optical Engineering ;$vv. 1637
504 $aIncludes bibliographical references and index.
650 0 $aPollution$xMeasurement$xCongresses.
650 0 $aEnvironmental monitoring$xCongresses.
650 0 $aLaser spectroscopy$xCongresses.
700 20 $aVo-Dinh, Tuan.
710 20 $aSociety of Photo-optical Instrumentation Engineers.
830 0 $aProceedings of SPIE--the International Society for Optical Engineering ;$vv. 1637.