| Record ID | harvard_bibliographic_metadata/ab.bib.11.20150123.full.mrc:806815304:1641 |
| Source | harvard_bibliographic_metadata |
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LEADER: 01641cam a2200373Ia 4500
001 011905417-5
005 20090325154412.0
008 090320s2009 waua b 101 0 eng d
020 $a9780819474896
020 $a0819474894
035 0 $aocn316574519
040 $aLHL$cLHL$dBTCTA
050 00 $aTK8315$b.T55 2009
090 $aTK8315$b.T545 2009
245 00 $aThree-dimensional imaging metrology :$b19-20 January 2009, San Jose, California, USA /$cJ. Angelo Beraldin ... [et al.], editors ; sponsored and published by IS&T--The Society for Imaging Science and Technology [and] SPIE.
246 33 $a3D imaging metrology
260 $aBellingham, Wash., USA :$bSPIE,$cc2009.
300 $a1 v. (various pagings). :$bill. ;$c28 cm.
490 1 $aProceedings of Electronic Imaging Science and Technology
490 1 $aProceedings of SPIE ;$vv. 7239
500 $a" ... first conference on 3D Imaging Metrology ..." -- introduction (p. ix)
504 $aIncludes bibliographical references and index.
650 0 $aThree-dimensional display systems$vCongresses.
650 0 $aLasers$vCongresses.
650 0 $aMeasurement$vCongresses.
650 0 $aTriangulation$vCongresses.
650 0 $aEngineering inspection$vCongresses.
700 1 $aBeraldin, Jean Angelo,$d1960-
710 2 $aIS & T--the Society for Imaging Science and Technology.
710 2 $aSPIE (Society)
811 2 $aElectronic Imaging Science and Technology Symposium.$tProceedings of Electronic Imaging Science and Technology.
830 0 $aProceedings of SPIE--the International Society for Optical Engineering ;$vv. 7239.
988 $a20090325
906 $0OCLC