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Last edited by
ww2archive
December 10, 2015 |
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Institute for Applied Technology (U.S.). Electronic Technology Division
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Semiconductor measurement technology: Permanent Damage Effects Of Nuclear Radiation On The X Band Performance Of Silicon Schottky Barrier Microwave Mixer Diodes
by
Kenney, James M.
and
Institute for Applied Technology (U.S.)...
First published in 1976
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1 edition
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Subjects
Diodes, Schottky-barrier
,
Effect of radiation on
,
Microwave measurements
,
Mixing circuits
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OLID: OL7275511A
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Created December 10, 2015
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December 10, 2015
Created by
ww2archive
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