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Last edited by
ImportBot
April 10, 2010 |
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Lawrence Joseph Sykes
Born
1955
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The sensitivity of two beam transmission electron microscope images to the structure of small crystal defects
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Lawrence Joseph Sykes
First published in 1981
1 edition
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Born
1955
Subjects
Crystals
Defects
Electron microscopy
Transmission electron microscopes
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ID Numbers
OLID: OL6796840A
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