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Last edited by ImportBot
September 20, 2008 | History
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David R. Deboer

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  • Cover of: The Georgia Tech high sensitivity microwave measurement system

    First published in 1996 1 edition in 1 language
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Subjects
Absorptivity, Measuring instruments, Microwaves, Planetary atmospheres, Planets, Refractivity

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ID Numbers

  • OLID: OL4897540A

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History

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September 20, 2008 Created by ImportBot Imported from Oregon Libraries MARC record