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Last edited anonymously
April 30, 2008 | History
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Peisen S. Huang

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5 works Add another?

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  • Cover of: Two- and three-dimensional methods for inspection and metrology IV: 1-3 October, 2006, Boston, Massachusetts, USA

    First published in 2006 2 editions in 1 language
    Not in Library

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  • Cover of: Optical metrology and inspection for industrial applications: 18-20 October 2010

    First published in 2010 1 edition in 1 language
    Not in Library

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  • Cover of: Optical inspection and metrology for non-optics industries: 3-4 August 2009, San Diego, California, United States

    First published in 2009 1 edition in 1 language
    Not in Library

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  • Cover of: Two- and three-dimensional methods for inspection and metrology V: 11-12 September 2007, Boston, Massachusetts, USA

    First published in 2007 1 edition in 1 language
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  • Cover of: Two- and three-dimensional methods for inspection and metrology VI: 10-11 August 2008, San Diego, California, USA

    First published in 2008 1 edition in 1 language
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We need a photo of Peisen S. Huang

Subjects
Congresses, Optical measurements, Optical methods, Quality control, Metrology, Three-dimensional display systems, Computer vision, Imaging systems, Engineering inspection, Industrial applications, Interferometry, Optical detectors

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ID Numbers

  • OLID: OL3618049A

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History

Download catalog record: RDF / JSON
April 30, 2008 Created by an anonymous user initial import