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Last edited anonymously
April 29, 2008 | History
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Luu T. Nguyen

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  • Cover of: Electronic packaging reliability: presented at the 1993 ASME Winter Annual Meeting, New Orleans, Louisiana, November 28-December 3, 1993

    First published in 1993 — 1 edition
    Not in Library

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  • Cover of: Electronic Packaging Reliability: Presented at the 1993 Asme Winter Annual Meeting, New Orleans, Louisiana, November 28-December 3, 1993 (AMD)

    First published in 1993 — 1 edition
    Not in Library

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  • Cover of: Plastic-encapsulated microelectronics: materials, processes, quality, reliability, and applications

    First published in 1995 — 1 edition
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  • Cover of: New characterization techniques for thin polymer films

    First published in 1990 — 1 edition
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Subjects

Electronic packaging, Congresses, Materials, Microelectronic packaging, Microelectronics, Microencapsulation, Plastic films, Plastics in packaging, Polymers, Polymers, testing, Reliability, Testing

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ID Numbers

  • OLID: OL2782797A

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History

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April 29, 2008 Created by an anonymous user initial import