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Last edited anonymously
April 29, 2008 | History

José Pineda de Gyvez

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  • Cover of: Low-Power High-Resolution Analog to Digital Converters: Design, Test and Calibration

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  • Cover of: Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits (Frontiers in Electronic Testing)

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  • Cover of: Integrated Circuit Defect-Sensitivity: Theory and Computational Models

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  • Cover of: Integrated circuit manufacturability

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April 29, 2008 Created by an anonymous user initial import