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Subjects
Ellipsometry, Ellipsométrie, Vacuum technology, Case studies, Couches minces, Dictionaries, Dünne Schicht, Ellipsometrie, Espectrometria, Filmes finos, Materiais, Materials, Materials, optical properties, Matériaux, Nanoscience, Oberflächeneigenschaft, Optical properties, Phase transformations (statistical physics), Physics, Polarization (light), Propriedades óticas, Propriétés optiques, Reflectance spectroscopy, Reflectometer, ReflektometrieID Numbers
- OLID: OL234781A
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September 7, 2008 | Edited by RenameBot | fix author name |
April 1, 2008 | Created by an anonymous user | initial import |