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Last edited by Open Library Bot
April 28, 2010 | History

The IEEE International Workshop on Defect and Fault Tolerance in Vlsi Systems: Proceedings 1 edition

Cover of: The IEEE International Workshop on Defect and Fault Tolerance in Vlsi Systems: Proceedings | IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems

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The IEEE International Workshop on Defect and Fault Tolerance in Vlsi Systems: Proceedings
November 13-15, 1995 Lafayette, Louisiana

Published November 1995 by IEEE Computer Society Press .
Written in English.

The Physical Object

Format
Hardcover
Number of pages
305
Dimensions
9.5 x 6.5 x 1 inches
Weight
1.4 pounds

ID Numbers

Open Library
OL11390040M
ISBN 10
0818671076
ISBN 13
9780818671074
Goodreads
3328287

History

Download catalog record: RDF / JSON
April 28, 2010 Edited by Open Library Bot Linked existing covers to the work.
December 10, 2009 Created by WorkBot add works page