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Last edited by Open Library Bot
April 28, 2010 | History

1997 IEEE International Symposium on Defect and Fault Tolerance in Vlsi Systems 1 edition

Cover of: 1997 IEEE International Symposium on Defect and Fault Tolerance in Vlsi Systems | IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems

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1997 IEEE International Symposium on Defect and Fault Tolerance in Vlsi Systems
October 20-22, 1997 Paris, France

Published October 1997 by Institute of Electrical & Electronics Enginee .
Written in English.

The Physical Object

Format
Paperback
Number of pages
314
Dimensions
8.8 x 6 x 0.5 inches
Weight
15.2 ounces

ID Numbers

Open Library
OL11390485M
ISBN 10
0818681683
ISBN 13
9780818681684
Goodreads
3328283

History

Download catalog record: RDF / JSON
April 28, 2010 Edited by Open Library Bot Linked existing covers to the work.
December 10, 2009 Created by WorkBot add works page