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Cover of: Memory Technology, Design and Testing | Design and Testing (8th : 2000 : San Jose, Calif.) IEEE International Workshop on Memory Technology

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Memory Technology, Design and Testing
2000 IEEE International Workshop

Published November 2000 by Institute of Electrical & Electronics Enginee .
Written in English.

The Physical Object

Format
Paperback
Number of pages
131
Dimensions
10.5 x 8.2 x 0.5 inches
Weight
12 ounces

ID Numbers

Open Library
OL8067410M
ISBN 10
0769506895
ISBN 13
9780769506890
Goodreads
3523683

History

Download catalog record: RDF / JSON
April 28, 2010 Edited by Open Library Bot Linked existing covers to the work.
December 10, 2009 Created by WorkBot add works page