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December 5, 2010 | History

Measurement of the thickness and refractive index of evaporated dielectric films 1 edition

Measurement of the thickness and refractive index of evaporated dielec ...
Wilhelmus van Vonno

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Measurement of the thickness and refractive index of evaporated dielectric films.

Published 1968 by Waltman in Delft .
Written in English.

Edition Notes

Bibliography: p. 77-78.
Proefschrift--Delft.
Stellingen: [4] p. inserted.
Summary in Dutch.

Classifications

Dewey Decimal Class
537.2/4
Library of Congress
QC585 .V64

The Physical Object

Pagination
80 p.
Number of pages
80

ID Numbers

Open Library
OL5766095M
LC Control Number
71387809

History Created December 10, 2009 · 2 revisions Download catalog record: RDF / JSON

December 5, 2010 Edited by Open Library Bot Added subjects from MARC records.
December 10, 2009 Created by WorkBot add works page