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Last edited by Open Library Bot
December 5, 2010 | History

Microelectronic test patterns 1 edition

Microelectronic test patterns
Martin G. Buehler

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Microelectronic test patterns
an overview
[by] Martin G. Buehler.

Published 1974 by National Bureau of Standards; [for sale by the Supt. of Docs., U.S. Govt. Print. Off.] in [Washington] .
Written in English.

Edition Notes

Bibliography: p. 11.
"Jointly sponsored by the Defense Advanced Research Projects Agency, the Defense Nuclear Agency, and the National Bureau of Standards."

Series
Semiconductor measurement technology, NBS special publication 400-6, NBS special publication ;, 400-6.

Classifications

Dewey Decimal Class
389/.08 s, 621.381/73
Library of Congress
QC100 .U57 no. 400-6, TK7874 .U57 no. 400-6

The Physical Object

Pagination
19 p.
Number of pages
19

ID Numbers

Open Library
OL5051537M
LC Control Number
74013001

History Created December 10, 2009 · 2 revisions Download catalog record: RDF / JSON

December 5, 2010 Edited by Open Library Bot Added subjects from MARC records.
December 10, 2009 Created by WorkBot add works page