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December 5, 2010 | History

Defects in PN junctions and MOS capacitors observed using thermally stimulated current and capacitance measurements, videotape script 1 edition

Defects in PN junctions and MOS capacitors observed using thermally st ...
Martin G. Buehler

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Defects in PN junctions and MOS capacitors observed using thermally stimulated current and capacitance measurements, videotape script
Martin G. Buehler.

Published 1976 by U.S. Dept. of Commerce, National Bureau of Standards : for sale by the Supt. of Docs., U.S. Govt. Print. Off. in Washington .
Written in English.

Edition Notes

Bibliography: p. 14.

Series
Semiconductor measurement technology, NBS special publication ; 400-26, NBS special publication ;, 400-26.

Classifications

Dewey Decimal Class
602/.1 s, 621.3815/28
Library of Congress
QC100 .U57 no. 400-26, TK7871.85 .U57 no. 400-26

The Physical Object

Pagination
iii, 14 p. :
Number of pages
14

ID Numbers

Open Library
OL5016371M
LC Control Number
76608059

History Created December 10, 2009 · 2 revisions Download catalog record: RDF / JSON

December 5, 2010 Edited by Open Library Bot Added subjects from MARC records.
December 10, 2009 Created by WorkBot add works page