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Last edited by Open Library Bot
December 5, 2010 | History

Defects in PN junctions and MOS capacitors observed using thermally stimulated current and capacitance measurements, videotape script 1 editions

Defects in PN junctions and MOS capacitors observed using thermally st ...
Martin G. Buehler
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1 edition First published in 1976

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Cover of: Defects in PN junctions and MOS capacitors observed using thermally stimulated current and capacitance measurements, videotape script
1976, U.S. Dept. of Commerce, National Bureau of Standards : for sale by the Supt. of Docs., U.S. Govt. Print. Off.
Defects in PN junctions and MOS capacitors observed using thermally stimulated current and capacitance measurements, videotape script
in English

History

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December 5, 2010 Edited by Open Library Bot Added subjects from MARC records.
December 10, 2009 Created by WorkBot add works page