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Last edited by Open Library Bot
December 5, 2010 | History

Beam injection assessment of microstructures in semiconductors 1 edition

Cover of: Beam injection assessment of microstructures in semiconductors | International Workshop on Beam Injection Assessment of Microstructures in Semiconductors (6th 2000 Fukuoka, Japan)

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Beam injection assessment of microstructures in semiconductors
BIAMS 2000 : proceedings of the 6th International Workshop on Beam Injection Assessment of Mictrostructures in Semiconductors held in Fukuoka, Japan, November 12-16, 2000
editors: Hajime Tomokage and Takashi Sekiguchi.

Published 2001 by Scitec Publications in Uetikon-Zuerich, Switzerland .
Written in English.

Edition Notes

Includes bibliographical references and index.

Series
Diffusion and defect data--solid state data., Pt. B, Solid state phenomena,, v. 78-79, Diffusion and defect data., v. 78-79.
Genre
Congresses.

Classifications

Dewey Decimal Class
621.3815/2
Library of Congress
TK7871.85 .I584365 2001

The Physical Object

Pagination
xiii, 441 p. :
Number of pages
441

ID Numbers

Open Library
OL3970668M
ISBN 10
3908450616
LC Control Number
2001277780
OCLC/WorldCat
47095956
Goodreads
1648347

History Created December 10, 2009 · 3 revisions Download catalog record: RDF / JSON

December 5, 2010 Edited by Open Library Bot Added subjects from MARC records.
April 28, 2010 Edited by Open Library Bot Linked existing covers to the work.
December 10, 2009 Created by WorkBot add works page