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Cover of: Proceedings | IEEE International Workshop on Memory Technology, Design, and Testing (9th 2001 San Jose, Calif.)

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Proceedings
2001 IEEE International Workshop on Memory Technology, Design, and Testing : August 6-7, 2001, San Jose, California
editors, Yervant Zorian ... [et al.] ; sponsored by IEEE Computer Society, IEEE Computer Society Technical Council on Test Technology, IEEE Computer Society Technical Committee on VLSI ; in cooperation with IEEE Solid-State Circuits Society.

Published 2001 by IEEE Computer Society in Los Alamitos, Calif .
Written in English.

Edition Notes

Includes bibliographical references and index.
"IEEE Computer Society Order Number PR01242"--T.p. verso.
"... the ninth in a series of annual workshops ..."--P. vii.
Also available via the World Wide Web.

Genre
Congresses.
Other Titles
Records of the IEEE International Workshop on Memory Technology, Design, and Testing 2000

Classifications

Dewey Decimal Class
621.39/732
Library of Congress
TK7895.M4 I334 2001

The Physical Object

Pagination
viii, 108 p. :
Number of pages
108

ID Numbers

Open Library
OL3970400M
ISBN 10
0769512429, 0769512437, 0769512445
LC Control Number
2001277459
OCLC/WorldCat
47860768
Goodreads
5058240

History Created December 10, 2009 · 3 revisions Download catalog record: RDF / JSON

December 5, 2010 Edited by Open Library Bot Added subjects from MARC records.
April 28, 2010 Edited by Open Library Bot Linked existing covers to the work.
December 10, 2009 Created by WorkBot add works page