Open Library logo
New Feature: You can now embed Open Library books on your website!   Learn More
Last edited by Open Library Bot
December 5, 2010 | History

Records of the 2000 IEEE International Workshop on Memory Technology, Design and Testing 1 editions

Cover of: Records of the 2000 IEEE International Workshop on Memory Technology, Design and Testing | IEEE International Workshop on Memory Technology, Design and Testing (8th 2000 San Jose, Calif.)
There's no description for this book yet. Can you add one?

1 edition

Edition Read Locate Buy

History

Download catalog record: RDF / JSON
December 5, 2010 Edited by Open Library Bot Added subjects from MARC records.
April 28, 2010 Edited by Open Library Bot Linked existing covers to the work.
December 10, 2009 Created by WorkBot add works page