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Last edited by Open Library Bot
December 5, 2010 | History

Records of the 2000 IEEE International Workshop on Memory Technology, Design and Testing 1 edition

Cover of: Records of the 2000 IEEE International Workshop on Memory Technology, Design and Testing | IEEE International Workshop on Memory Technology, Design and Testing (8th 2000 San Jose, Calif.)

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Records of the 2000 IEEE International Workshop on Memory Technology, Design and Testing
August 7-8, 2000, San Jose, California
edited by R. Rajsuman and T. Wik ; sponsored by IEEE Computer Society, IEEE Computer Society Technical Council on Test Technology, IEEE Computer Society Technical Committee on VLSI ; in cooperation with IEEE Solid-State Circuits Society.

Published 2000 by IEEE Computer Society in Los Alamitos, Calif .
Written in English.

Edition Notes

Includes bibliographical references and author index.
"IEEE Computer Society Order Number PR00689"--T.p. verso.
"This is the 8th year of this exciting event"--P. viii.
Also available via the World Wide Web with additional title: Memory Technology, Design and Testing, 2000, records of the 2000 IEEE International Workshop on.

Genre
Congresses.
Other Titles
Records of the IEEE International Workshop on Memory Technology, Design and Testing 2000, Memory Technology, Design and Testing, 2000, records of the 2000 IEEE International Workshop on.

Classifications

Dewey Decimal Class
621.39/732
Library of Congress
TK7895.M4 I334 2000

The Physical Object

Pagination
x, 131 p. :
Number of pages
131

ID Numbers

Open Library
OL3965819M
ISBN 10
0769506895, 0769506909, 0769506917
LC Control Number
2001270775
OCLC/WorldCat
44843886
Goodreads
3523683

History

Download catalog record: RDF / JSON
December 5, 2010 Edited by Open Library Bot Added subjects from MARC records.
April 28, 2010 Edited by Open Library Bot Linked existing covers to the work.
December 10, 2009 Created by WorkBot add works page