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December 4, 2010 | History

Evaluation of advanced semiconductor materials by electron microscopy 1 edition

Evaluation of advanced semiconductor materials by electron microscopy
NATO Advanced Research Worksho ...

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Evaluation of advanced semiconductor materials by electron microscopy
edited by David Cherns.

Published 1989 by Plenum Press in New York .
Written in English.

Edition Notes

Includes bibliographical references.
"Proceedings of a NATO Advanced Research Workshop on the Evaluation of Advanced Semiconductor Materials by Electron Microscopy, held September 12-17, 1988, in Bristol, United Kingdom"--Verso t.p.
"Held within the program of activities of the NATO Special Program on Condensed Systems of Low Dimensionality, running from 1983 to 1988 as part of the activities of the NATO Science Committee"--P. [v].
"Published in cooperation with NATO Scientific Affairs Division."

Series
NATO ASI series. Series B, Physics ;, vol. 203, NATO ASI series., v. 203.

Classifications

Dewey Decimal Class
530.4/1
Library of Congress
QC611.6.S9 N36 1988

The Physical Object

Pagination
xi, 412 p. :
Number of pages
412

ID Numbers

Open Library
OL2196697M
ISBN 10
0306433621
LC Control Number
89016354
Goodreads
4835299

History

Download catalog record: RDF / JSON
December 4, 2010 Edited by Open Library Bot Added subjects from MARC records.
December 10, 2009 Created by WorkBot add works page