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Last edited by Open Library Bot
December 5, 2010 | History

Defect analysis in electron microscopy 1 edition

Defect analysis in electron microscopy
M. H. Loretto

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Defect analysis in electron microscopy
M. H. Loretto and R. E. Smallman.

Published 1975 by Chapman and Hall, Wiley : distributed by Halstead Press in London, New York .
Written in English.

Edition Notes

Bibliography: p. 131.
"A Halsted Press book."
Includes index.

Classifications

Dewey Decimal Class
548/.84
Library of Congress
QD921 .L67

The Physical Object

Pagination
ix, 134 p. :
Number of pages
134

ID Numbers

Open Library
OL5201405M
ISBN 10
0412137607, 0412137704
LC Control Number
75025615
Goodreads
5409857

History Created December 10, 2009 · 2 revisions Download catalog record: RDF / JSON

December 5, 2010 Edited by Open Library Bot Added subjects from MARC records.
December 10, 2009 Created by WorkBot add works page