{"title": "Reliability and Materials Issues of III-V and II-VI Semiconductor Optical and Electron Devices and Materials II", "subjects": ["Materials", "Semiconductors", "Microelectronics", "Reliability", "Congresses"], "key": "/works/OL21049362W", "authors": [{"type": {"key": "/type/author_role"}, "author": {"key": "/authors/OL536044A"}}, {"type": {"key": "/type/author_role"}, "author": {"key": "/authors/OL223640A"}}, {"type": {"key": "/type/author_role"}, "author": {"key": "/authors/OL8049263A"}}, {"type": {"key": "/type/author_role"}, "author": {"key": "/authors/OL8049264A"}}], "type": {"key": "/type/work"}, "covers": [13850050], "latest_revision": 3, "revision": 3, "created": {"type": "/type/datetime", "value": "2020-08-03T07:25:39.101321"}, "last_modified": {"type": "/type/datetime", "value": "2023-04-07T00:36:47.594942"}}