Cover of: Scanning electron microscopy | Ludwig Reimer
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Last edited by Open Library Bot
April 28, 2010 | History
An edition of Scanning electron microscopy (1985)

Scanning electron microscopy

physics of image formation and microanalysis

2nd completely rev. and updated ed.
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This edition published in by Springer in Berlin, . New York.

Written in English

527 pages

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Previews available in: English

Edition Availability
Cover of: Scanning electron microscopy
Scanning electron microscopy: physics of image formation and microanalysis
1998, Springer
in English - 2nd completely rev. and updated ed.
Cover of: Scanning Electron Microscopy
Cover of: Scanning electron microscopy

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Scanning electron microscopy

First published in 1985



First Sentence

"Unlike transmission electron microscopy (TEM) described in the counterpart to this book [1.1], scanning electron microscopy (SEM) can image and analyse bulk specimens [1.2-28]."

Scanning electron microscopy

physics of image formation and microanalysis

2nd completely rev. and updated ed.

This edition published in by Springer in Berlin, . New York.


Edition Notes

Includes bibliographical references and index.

Series
Springer series in optical sciences ;, v. 45

Classifications

Dewey Decimal Class
502/.8/25
Library of Congress
QH212.S3 R452 1998

ID Numbers

Open Library
OL365830M
Internet Archive
scanningelectron0000reim
ISBN 10
3540639764
LC Control Number
98026178
Library Thing
6275679
Goodreads
2605545

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History

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April 28, 2010 Edited by Open Library Bot Linked existing covers to the work.
February 1, 2010 Edited by WorkBot add more information to works
December 9, 2009 Created by WorkBot add works page