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November 16, 2011 | History

Reliability and radiation effects in compound semiconductors 1 edition

Reliability and radiation effects in compound semiconductors
Allan Johnston

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Reliability and radiation effects in compound semiconductors
Allan Johnston

Published 2010 by World Scientific in Hackensack, NJ, London .
Written in English.

Table of Contents

Semiconductor fundamentals
Transistor technologies
Optoelectronics
Reliability fundamentals
Compound semiconductor reliability
Optoelectronic device reliability
Radiation environments
Interactions of radiation with semiconductors
Displacement damage in compound semiconductors
Displacement damage in optoelectronic devices
Radiation damage in optocouplers
Effects from single particles.

Edition Notes

Includes bibliographical references and index.

Classifications

Dewey Decimal Class
621.38152
Library of Congress
TK7871.99.C65 J64 2010

The Physical Object

Pagination
xii, 363 p. :
Number of pages
363

ID Numbers

Open Library
OL25102439M
ISBN 10
981427710X
ISBN 13
9789814277105
LC Control Number
2011290141
OCLC/WorldCat
311763222

History Created November 16, 2011 · 1 revision Download catalog record: RDF / JSON

November 16, 2011 Created by LC Bot import new book