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October 21, 2010 | History

Condensed guide for the Stanford revision of the Binet-Simon intelligence tests 1 edition

Cover of: Condensed guide for the Stanford revision of the Binet-Simon intelligence tests | Terman, Lewis Madison
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Condensed guide for the Stanford revision of the Binet-Simon intelligence tests
by Lewis M. Terman

Published by Houghton Mifflin Company in Boston, New York [etc.] .

Edition Notes

"Abbreviated filing record card for the Stanford revision of the Binet-Simon tests": 1 fold form laid in.

Series
Riverside textbooks in education, ed. by E.P. Cubberley ... Division of secondary education, under the editorial direction of Alexander Inglis

The Physical Object

Pagination
32 p.
Number of pages
32

ID Numbers

Open Library
OL24387942M
Internet Archive
condensedguidefo00yyytuoft
LC Control Number
20010063

History

Download catalog record: RDF / JSON
October 21, 2010 Created by ImportBot initial import