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January 29, 2010 | History

Scanning electron microscopy 1971 1 edition

Scanning electron microscopy 1971
Scanning Electron Microscope S ...

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Scanning electron microscopy 1971
proceedings of the: part 1 (April 27-29, 1971) Fourth Annual Scanning Electron Microscope Symposium and part 2 (April 30, 1971) Workshop on Forensic Applications of the Scanning Electron Microscope
edited by Om Johari and Irene Corvin.

Published 1971 by I.I.T. Research Institute in Chicago .
Written in English.

Edition Notes

Part 1 sponsored by the Illinois Institute of Technology Research Institute; part 2 sponsored by the National Institute of Law Enforcement and Criminal Justice.

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