Click here to skip to this page's main content.

New to the Open Library? — Learn how it works
Want to support Open Library? Until April 30, we'll double your donation! Help us build the great digital library.
Last edited by Open Library Bot
December 4, 2010 | History

CMOS SRAM circuit design and parametric test in nano-scaled technologies 1 edition

CMOS SRAM circuit design and parametric test in nano-scaled technologi ...
Pavlov, Andrei Ph. D.

No ebook available.


Prefer the physical book? Check nearby libraries powered by WorldCat


Buy

Amazon
Better World Books $168.63 (used)
¬°Ay, caramba! There's no description for this book yet. Can you help?
There is only 1 edition record, so we'll show it here...  •  Add edition?

CMOS SRAM circuit design and parametric test in nano-scaled technologies
process-aware SRAM design and test
Andrei Pavlov, Manoj Sachdev.

Published 2008 by Springer in [Dordrecht] .
Written in English.

Edition Notes

Includes bibliographical references and index.

Series
Frontiers in electronic testing -- 40

Classifications

Dewey Decimal Class
621.38152
Library of Congress
TK7871.99.M44 P38 2008

The Physical Object

Pagination
xvi, 193 p. :
Number of pages
193

ID Numbers

Open Library
OL22565967M
ISBN 13
9781402083624, 9781402083631
LC Control Number
2008924192
Library Thing
5751492
Goodreads
5028070

History Created December 11, 2009 · 3 revisions Download catalog record: RDF / JSON

December 4, 2010 Edited by Open Library Bot Added subjects from MARC records.
January 29, 2010 Edited by WorkBot add more information to works
December 11, 2009 Created by WorkBot add works page