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January 24, 2010 | History

The x-ray time of flight method for investigation of ghosting in amorphous selenium based flat panel medical x-ray imagers 1 edition

The x-ray time of flight method for investigation of ghosting in amorp ...
Andreas W. Rau

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The x-ray time of flight method for investigation of ghosting in amorphous selenium based flat panel medical x-ray imagers.

Published 2005 .
Written in English.

About the Book

In this thesis, the x-ray time-of-flight (TOF) method was developed for the investigation of ghosting (i.e. radiation-induced changes of sensitivity) in amorphous selenium (a-Se) based real-time flat-panel imagers (FPIs). The method consists of irradiating layers of a-Se with short x-ray pulses. From the current generated in the a-Se layer, ghosting is quantified and the ghosting parameters (charge carrier generation rate, and carrier lifetimes and mobilities) are assessed. The x-ray TOF method is novel in that (1) ghosting and ghosting parameters can be measured simultaneously, (2) transport of holes and electrons can be isolated and (3) the method is applicable to practical a-Se layers with blocking contacts. This work provides the basis for understanding ghosting in a-Se based FPIs thus making them fit for high frame-rate and high dose x-ray imaging applications.

Edition Notes

Source: Masters Abstracts International, Volume: 44-02, page: 0844.

Thesis (M.Sc.)--University of Toronto, 2005.

Electronic version licensed for access by U. of T. users.

GERSTEIN MICROTEXT copy on microfiche (2 microfiches).

The Physical Object

Pagination
113 leaves.
Number of pages
113

ID Numbers

Open Library
OL19217281M
ISBN 10
049407387X

History

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January 24, 2010 Edited by WorkBot add more information to works
December 11, 2009 Created by WorkBot add works page