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December 11, 2009 | History

Breakdown and charge trapping in sicilion dioxide films on silicon 1 edition

Breakdown and charge trapping in sicilion dioxide films on silicon
Stephanie K. Haywood

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Breakdown and charge trapping in sicilion dioxide films on silicon.

Published 1986 in [Unpublished] .
Written in English.

Edition Notes

Ph.D. thesis, C.N.A.A. , 1986.

The Physical Object

Pagination
1 v :

ID Numbers

Open Library
OL13714553M

History Created December 11, 2009 · 1 revision Download catalog record: RDF / JSON

December 11, 2009 Created by WorkBot add works page