| Record ID | marc_university_of_toronto/uoft.marc:906983926:989 |
| Source | University of Toronto |
| Download Link | /show-records/marc_university_of_toronto/uoft.marc:906983926:989?format=raw |
LEADER: 00989cam 22002290 4500
008 670701s1955 ||| eng x
050 4 $aQD945$bP4
090 8 $aQD 945 .P4$bGERSTM$c1
090 8 $aQD 945 .P4$bPHYS$c2
090 8 $aQD 945 .P4$bENGI$c3
100 10 $aPeiser, H. S,
245 10 $aX-ray diffraction by polycrystalline materials.$cTechnical editors: H.S. Peiser, H.P. Rooksby [and] A.J.C. Wilson.
260 0 $aLondon$bInstitute of Physics$c1955
300 $a725p.
490 1 $aPhysics in industry
650 0 $aCrystallography
650 0 $aX-rays$xDiffraction
810 2 $aInstitute of Physics, London.$tPhysics in industry
948 $a07/14/1992$b04/08/2002
949 $aQD945 .P4$wLC$c1$i31761008425605$d15/8/1996$lSTACKS$mGERSTEIN$n9$q9$rY$sY$tBOOK$u26/8/1992
949 $aQD945 .P4$wLC$c1$i31761014891105$d5/5/2002$lSTACKS$mENGI_CSCI$n18$q18$rY$sY$tBOOK$u26/8/1992
949 $aQD945 .P4$wLC$c1$i31761049589633$d6/5/2003$e21/11/2002$lSTACKS$mPHYSICS$n2$rY$sY$tBOOK$u29/9/1998