| Record ID | marc_columbia/Columbia-extract-20221130-002.mrc:177708302:1556 |
| Source | marc_columbia |
| Download Link | /show-records/marc_columbia/Columbia-extract-20221130-002.mrc:177708302:1556?format=raw |
LEADER: 01556cam a22003858a 4500
001 641612
005 20220525214247.0
008 880418t19881988enka b 001 0 eng
010 $a 87028510
020 $a086380067X
020 $a0471918261 (Wiley)
035 $a(OCoLC)16870009
035 $a(OCoLC)ocm16870009
035 $a(CStRLIN)NYCG88-B27358
035 $9ACU8374CU
035 $a(NNC)641612
035 $a641612
040 $dCSt
050 00 $aTA1632$b.W55 1988
082 0 $a621.36/7$219
090 $aTA1632$b.W55 1988
100 1 $aWilson, Roland,$d1949-$0http://id.loc.gov/authorities/names/n87878220
245 10 $aImage segmentation and uncertainty /$cRoland Wilson and Michael Spann.
260 $aLetchworth, Herts., England :$bResearch Studies Press ;$aNew York :$bWiley,$c[1988], ©1988.
300 $ax, 180 pages :$billustrations ;$c24 cm.
336 $atext$2rdacontent
337 $aunmediated$2rdamedia
338 $avolume$2rdacarrier
490 1 $aElectronic & electrical engineering research studies. Pattern recognition & image processing series ;$v9
504 $aBibliography: p. 161-176.
500 $aIncludes index.
650 0 $aImage processing$xDigital techniques.$0http://id.loc.gov/authorities/subjects/sh85064447
700 1 $aSpann, Michael.$0http://id.loc.gov/authorities/names/nb2001008350
830 0 $aElectronic & electrical engineering research studies.$pPattern recognition & image processing series ;$v9.$0http://id.loc.gov/authorities/names/n42018745
852 00 $boff,eng$hTA1632$i.W55 1988