An edition of Infrared Characterization for Microelectronics (1999)

Infrared Characterization for Microelectronics

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Infrared Characterization for Microelectronic ...
W. S. Lau, W. S. Lau
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Last edited by ImportBot
August 17, 2023 | History
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An edition of Infrared Characterization for Microelectronics (1999)

Infrared Characterization for Microelectronics

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Publish Date
Publisher
World Scientific Publishing Co Pte Ltd
Language
English

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Previews available in: English

Subjects

Materials, Testing, Microelectronics, Infrared spectroscopy, Absorption spectra
Edition Availability
Cover of: Infrared Characterization for Microelectronics
Infrared Characterization for Microelectronics
1999, World Scientific Publishing Co Pte Ltd
in English
Cover of: Infrared Characterization for Microelectronics
Infrared Characterization for Microelectronics
September 1999, World Scientific Publishing Company, World Scientific Pub Co Inc
Hardcover in English

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Book Details

The Physical Object

Pagination
172

Edition Identifiers

Open Library
OL49250515M
ISBN 13
9789812817464

Work Identifiers

Work ID
OL9146817W

Source records

Better World Books record

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August 17, 2023 Created by ImportBot Imported from Better World Books record