Ellipsometry in the measurement of surfaces and thin films
symposium proceedings Washington 1963 : symposium held September 5-6, 1963, National Bureau of Standards, Washington
by Symposium on the Ellipsometer and its us...
Written in English.
|Series||National Bureau of Standards miscellaneous publication -- 256|
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History Created October 26, 2008 ·
|December 15, 2009||Edited by WorkBot||link works|
|October 26, 2008||Created by ImportBot||Initial record created, from Talis MARC record.|