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We need a book cover for: Ellipsometry in the measurement of surfaces and thin films
Last edited by WorkBot
December 15, 2009 | History
Ellipsometry in the measurement of surfaces and thin films
Symposium on the Ellipsometer ...

Ellipsometry in the measurement of surfaces and thin films
symposium proceedings Washington 1963 : symposium held September 5-6, 1963, National Bureau of Standards, Washington
edited by E. Passaglia, R.R. Stromberg and J. Kruger.

Published by U.S.G.P.O. in Washington .
Written in English.

Edition Notes

Series National Bureau of Standards miscellaneous publication -- 256

ID Numbers

Open Library OL20215778M

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History Created October 26, 2008 · 2 revisions
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December 15, 2009 Edited by WorkBot link works
October 26, 2008 Created by ImportBot Initial record created, from Talis MARC record.