An edition of VLSI Test Symposium (Vts 2000) Proceedings (2000)

VLSI Test Symposium (Vts 2000) Proceedings

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Cover of: VLSI Test Symposium (Vts 2000) Proceedings by IEEE Computer Society, IEEE Computer Society
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Last edited by MARC Bot
July 9, 2024 | History
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An edition of VLSI Test Symposium (Vts 2000) Proceedings (2000)

VLSI Test Symposium (Vts 2000) Proceedings

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Publish Date
Publisher
Institute of Electrical & Electronics Enginee
Language
English
Pages
478

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Subjects

Integrated circuits Very large scale integration Testing Congresses
Edition Availability
Cover of: VLSI Test Symposium (Vts 2000) Proceedings
VLSI Test Symposium (Vts 2000) Proceedings
May 2000, Institute of Electrical & Electronics Enginee
Paperback in English
Cover of: VLSI Test Symposium (Vts 2000) Proceedings
VLSI Test Symposium (Vts 2000) Proceedings
May 2000, Institute of Electrical & Electronics Enginee
Unknown Binding in English

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Book Details

Classifications

Library of Congress
TK7874 .I326 2000

The Physical Object

Format
Unknown Binding
Number of pages
478

Edition Identifiers

Open Library
OL10966554M
ISBN 10
0769506151
ISBN 13
9780769506159
OCLC/WorldCat
44052593

Work Identifiers

Work ID
OL6927294W

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