It looks like you're offline.
Donate
Change Website Language
Open Library logo
additional options menu
Last edited by ImportBot
November 9, 2008 | History
Edit

IEEE VLSI Test Symposium (18th 2000 Montréal, Québec)

1 work Add another?

Showing all works by author. Would you like to see only ebooks?

  • Cover of: 18th IEEE VLSI Test Symposium: proceedings : 30 April-4 May 2000, Montréal, Québec, Canada

    First published in 2000 1 edition in 1 language
    Not in Library

    My Reading Lists:

    Create a new list

    Check-In

    ×Close
    Add an optional check-in date. Check-in dates are used to track yearly reading goals.
    Today
We need a photo of IEEE VLSI Test Symposium (18th 2000 Montréal, Québec)
Subjects
Congresses, Integrated circuits, Testing, Very large scale integration

Lists

Add to List

My Reading Lists:

Create a new list

ID Numbers

  • OLID: OL6426822A

Links (outside Open Library)

No links yet. Add one?

History

Download catalog record: RDF / JSON
November 9, 2008 Created by ImportBot Imported from University of Toronto MARC record.