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Jinsuk Lee

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Step-stress accelerated degradation testing (SSADT) for photovoltaic (PV) devices and cells

by Jinsuk Lee First published in 2010 — 1 edition

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Statistical modeling of photovoltaic reliability using accelerated degradation techniques

by Jinsuk Lee First published in 2011 — 1 edition

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OLID: OL11676386A

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Created December 13, 2022
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December 13, 2022

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