| Born | 1958 |
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| Born | 1958 |
Subjects
Atom-probe field ion microscopy, Bulk solids, Materials, Metallic glasses, Microscopy, Surfaces (Physics), Tomography, Atomic structure, Atoms, Characterization and Evaluation of Materials, Crystallography, Effect of radiation on, Electrodes, Embrittlement, Field ion microscopes, Materials science, Nanotechnology, Nuclear pressure vessels, Solid state physics, Spectroscopy and Microscopy, Steel, Welded jointsID Numbers
- OLID: OL1005039A
- VIAF: 12632899
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Alternative names
- Miller, M.K. (Michael Kenneth)
- Miller, M.K
- Miller, Michael Kenneth
- Miller, Michael, 1958-
- Miller, Michael K. 19..-.... ingénieur
| July 28, 2024 | Edited by laurenbr1 | dob, viaf, akas |
| July 28, 2024 | Edited by laurenbr1 | Edited without comment. |
| August 20, 2008 | Edited by RenameBot | fix author name |
| April 1, 2008 | Created by an anonymous user | initial import |