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full text
Not available   84
authors
Harry A. Schafft   2
International Test Conference (18th 1987 Washington, D.C.)   2
International Test Conference (25th 1994 Washington D.C)   2
International Test Conference (34th 2003 Charlotte, N.C.)   2
Academic Forum for Test Technology (1984 Center for Microelectronic and Information Sciences, University of Minnesota, Minneapolis)   1
ELECTRO 99 (1999 Boston, Mass.)   1
subjects
Integrated circuits -- Testing -- Congresses.   [x]
Electronic digital computers -- Circuits -- Testing -- Congresses.   18
Semiconductors -- Testing -- Congresses.   17
Automatic test equipment -- Congresses.   16
Integrated circuits -- Defects -- Congresses.   8
Electronic apparatus and appliances -- Testing -- Congresses.   7
publication date
1980-1999   55
2000–now   21
1960-1979   8
languages
English   84
publishers
IEEE Computer Society Press   23
IEEE   20
Institute of Electrical and Electronics Engineers   12
International Test Conference   9
The Conference   7
available from IEEE Computer Society Publications Office   6
Proceedings by International Test Conference (1997 Washington, D.C.)
The Conference, 1997
Proceedings of the 1997 6th International Symposium on the Physical & Failure Analysis of Integrated Circuits [IPFA '97 by International Symposium on the Physical & Failure Analysis of Integrated Circuits (6th 1997 Singapore)
Institute of Electrical and Electronics Engineers, 1997
Proceedings of the 1995 5th International Symposium on the Physical & Failure Analysis of Integrated Circuits by International Symposium on the Physical & Failure Analysis of Integrated Circuits (5th 1995 Shangri-La Hotel, Singapore)
Institute of Electrical and Electronics Engineers, 1995
25th anniversary compendium of papers from International Test Conference by International Test Conference (25th 1994 Philadelphia, Pa.)
IEEE Computer Society Press, 1994
International Test Conference, 1991 by International Test Conference (22nd 1991 Nashville, Tenn.)
The Conference, 1991
Microelectronics manufacturing and reliability
SPIE, 1993
ETC 93, Third European Test Conference, Rotterdam, the Netherlands, April 19-22, 1993 by European Test Conference (3rd 1993 Rotterdam, Netherlands)
IEEE Computer Society Press, 1993
ETC91 by European Test Conference (2nd 1991 Munich, Germany)
VDE-Verlag, 1991
Electronics reliability and measurement technology
Noyes Data Corp., 1988
Proceedings of the 1st European Test Conference, Paris, April 12-14, 1989. by European Test Conference (1st 1989 Paris, France)
IEEE Computer Society Press, 1989
Meeting the tests of time by International Test Conference (20th 1989 Washington, DC)
IEEE Computer Society Press, 1989
Testing's impact on design & technology by International Test Conference (1986 Washington, D.C.)
IEEE Computer Society Press, 1986
Micron and submicron integrated circuit metrology
SPIE--International Society for Optical Engineering, 1985
The three faces of test by International Test Conference (15th 1984 Philadelphia, Pa.)
IEEE Computer Society Press, 1984
Proceedings by Microelectronics Measurement Technology Seminar (3rd 1981 San Jose, Calif.)
Benwill Pub. Corp., 1981
Curriculum for test technology
IEEE Computer Society Press, Order from IEEE Computer Society, 1983
ETS 2004 by IEEE European Test Symposium (9th 2004 Corsica, France)
IEEE Computer Society, 2004
European Test Symposium by IEEE European Test Symposium (10th 2004 Tallin, Estonia )
IEEE Computer Society Press, 2005
Quality productivity profit by International Test Conference (1982)
IEEE Computer Society Press, 1982
Proceedings of the 10th International Symposium on the Physical & Failure Analysis of Integrated Circuits by International Symposium on the Physical & Failure Analysis of Integrated Circuits (10th 2003 Singapore)
IEEE, 2003


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