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full text
Not available   13
authors
IEEE International Workshop on Defect Based Testing (2000 Montréal, Québec)   1
IEEE International Workshop on Defect Based Testing (2004 Napa, Calif.)   1
International Symposium on the Physical & Failure Analysis of Integrated Circuits (10th 2003 Singapore)   1
International Symposium on the Physical & Failure Analysis of Integrated Circuits (11th 2004 Taipei, Taiwan)   1
International Symposium on the Physical & Failure Analysis of Integrated Circuits (13th 2006 Singapore)   1
International Symposium on the Physical & Failure Analysis of Integrated Circuits (5th 1995 Shangri-La Hotel, Singapore)   1
subjects
Integrated circuits -- Defects -- Congresses.   [x]
Integrated circuits -- Testing -- Congresses.   8
Electrodiffusion -- Congresses.   3
Integrated circuits -- Reliability -- Congresses.   3
Thin film devices -- Defects -- Congresses.   3
Iddq testing -- Congresses.   2
publication date
2000–now   8
1980-1999   5
languages
English   13
publishers
IEEE   6
American Institute of Physics   3
Institute of Electrical and Electronics Engineers   2
IEEE Computer Society   1
SPIE   1
Proceedings of the 1997 6th International Symposium on the Physical & Failure Analysis of Integrated Circuits [IPFA '97 by International Symposium on the Physical & Failure Analysis of Integrated Circuits (6th 1997 Singapore)
Institute of Electrical and Electronics Engineers, 1997
Proceedings of the 1995 5th International Symposium on the Physical & Failure Analysis of Integrated Circuits by International Symposium on the Physical & Failure Analysis of Integrated Circuits (5th 1995 Shangri-La Hotel, Singapore)
Institute of Electrical and Electronics Engineers, 1995
Proceedings of the 10th International Symposium on the Physical & Failure Analysis of Integrated Circuits by International Symposium on the Physical & Failure Analysis of Integrated Circuits (10th 2003 Singapore)
IEEE, 2003
Proceedings of the 1999 7th International Symposium on the Physical & Failure Analysis of Integrated Circuits [IPFA '99 by International Symposium on the Physical & Failure Analysis of Integrated Circuits (7th 1999 Singapore)
IEEE, 1999
Proceedings of the 2001 8th International Symposium on the Physical & Failure Analysis of Integrated Circuits : IPFA 2001 by International Symposium on the Physical & Failure Analysis of Integrated Circuits (8th 2001 Singapore)
IEEE, 2001
Microelectronic manufacturing yield, reliability, and failure analysis IV
SPIE, 1998
Proceedings of the 11th International Symposium on the Physical & Failure Analysis of Integrated Circuits by International Symposium on the Physical & Failure Analysis of Integrated Circuits (11th 2004 Taipei, Taiwan)
IEEE, 2004
DBT 2004 by IEEE International Workshop on Defect Based Testing (2004 Napa, Calif.)
IEEE, 2004
2000 IEEE International Workshop on Defect Based Testing by IEEE International Workshop on Defect Based Testing (2000 Montréal, Québec)
IEEE Computer Society, 2000
Proceedings of the 13th International Symposium on the Physical & Failure Analysis of Integrated Circuits by International Symposium on the Physical & Failure Analysis of Integrated Circuits (13th 2006 Singapore)
IEEE, 2006
Stress-induced phenomena in metallization by International Workshop on Stress-Induced Phenomena in Metallization (6th 2001 Ithaca, N.Y.)
American Institute of Physics, 2002
Stress induced phenomena in metallization
American Institute of Physics, 1998
Stress-induced phenomena in metallization by International Workshop on Stress-Induced Phenomena in Metallization (7th 2004 Austin, Tex.)
American Institute of Physics, 2004
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