Proceedings of the 11th European Symposium on the Reliability of Electron Devices, Failure Physics and Analysis

by L.J. Balk, W.H. Gerling, E. Wolfgang
Published in October 1, 2000, Pergamon

Proceedings of the 11th European Symposium on the Reliability of Elec ...

L.J. Balk, W.H. Gerling, E. Wolfgang

Change Cover

Language:	English
Edition:	Cdr edition
Format:	CD-ROM
Dimensions:	5.5 x 4.8 x 0.2 inches
Weight:	3.2 ounces
ISBN 10:	0080439144
ISBN 13:	9780080439143
Subject:	Electrical engineering Technology & Engineering Technology & Industrial Arts Science/Mathematics Electronics - Microelectronics Technology / Electronics / Microelectronics Physics Reference