{"isbn_13": ["9780080439143"], "physical_format": "CD-ROM", "weight": "3.2 ounces", "languages": [{"key": "/l/eng"}], "publishers": ["Pergamon"], "title": "Proceedings of the 11th European Symposium on the Reliability of Electron Devices, Failure Physics and Analysis", "last_modified": {"type": "/type/datetime", "value": "2008-04-30 09:38:13.731961"}, "id": 13357156, "edition_name": "Cdr edition", "isbn_10": ["0080439144"], "publish_date": "October 1, 2000", "key": "/b/OL9978792M", "authors": [{"key": "/a/OL3360593A"}, {"key": "/a/OL3360595A"}, {"key": "/a/OL3360594A"}], "type": {"key": "/type/edition"}, "subjects": ["Electrical engineering", "Technology & Engineering", "Technology & Industrial Arts", "Science/Mathematics", "Electronics - Microelectronics", "Technology / Electronics / Microelectronics", "Physics", "Reference"], "physical_dimensions": "5.5 x 4.8 x 0.2 inches", "revision": 1}