Proceedings of the 1995 5th International Symposium on the Physical & Failure Analysis of Integrated Circuits

by International Symposium on the Physical & Failure Analysis of Integrated Circuits (5th 1995 Shangri-La Hotel, Singapore)
Published in 1995, Institute of Electrical and Electronics Engineers (Piscataway, NJ)

Proceedings of the 1995 5th International Symposium on the Physical & ...

International Symposium on the Physical & Failure Analysis of Integrated Circuits (5th 1995 Shangri-La Hotel, Singapore)

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Contributions:	Ong, Soon Huat., Radhakrishnan, M. K., IEEE Singapore Section. Reliability/CPMT/EDA Chapter., IEEE Electron Devices Society., National University of Singapore. Centre for IC Failure Analysis and Reliability., Institute of Microelectronics., Magnetics Technology Centre.
Other titles:	5th International Symposium on the Physical & Failure Analysis of Integrated Circuits
By statement:	edited by Soon Huat Ong, MK Radhakrishnan ; organised by, IEEE Singapore Section, Reliability/CPMT/EDS Chapter ; technical co-sponsorship, IEEE Electron Devices Society ; in co-operation with National University of Singapore, Centre for IC Failure Analysis and Reliability, Institute of Microelectronics, Singapore, [and] Magnetics Technology Centre, Singapore.
Language:	English
Pagination:	230 p. :
ISBN 10:	0780327977, 0780327985
LCCN:	95078165
Dewey:	621.3815
LC:	TK7874 .I47377 1995
Subject:	Integrated circuits — Defects — Congresses. Integrated circuits — Testing — Congresses.