{"lc_classifications": ["TK7874 .I47377 1995"], "contributions": ["Ong, Soon Huat.", "Radhakrishnan, M. K.", "IEEE Singapore Section. Reliability/CPMT/EDA Chapter.", "IEEE Electron Devices Society.", "National University of Singapore. Centre for IC Failure Analysis and Reliability.", "Institute of Microelectronics.", "Magnetics Technology Centre."], "id": 1284398, "title": "Proceedings of the 1995 5th International Symposium on the Physical & Failure Analysis of Integrated Circuits", "languages": [{"key": "/l/eng"}], "subjects": ["Integrated circuits -- Defects -- Congresses.", "Integrated circuits -- Testing -- Congresses."], "publish_country": "nju", "by_statement": "edited by Soon Huat Ong, MK Radhakrishnan ; organised by, IEEE Singapore Section, Reliability/CPMT/EDS Chapter ; technical co-sponsorship, IEEE Electron Devices Society ; in co-operation with National University of Singapore, Centre for IC Failure Analysis and Reliability, Institute of Microelectronics, Singapore, [and] Magnetics Technology Centre, Singapore.", "type": {"key": "/type/edition"}, "revision": 1, "other_titles": ["5th International Symposium on the Physical & Failure Analysis of Integrated Circuits"], "publishers": ["Institute of Electrical and Electronics Engineers"], "last_modified": {"type": "/type/datetime", "value": "2008-04-01 03:28:50.625462"}, "key": "/b/OL823074M", "authors": [{"key": "/a/OL461230A"}], "publish_places": ["Piscataway, NJ"], "pagination": "230 p. :", "dewey_decimal_class": ["621.3815"], "notes": {"type": "/type/text", "value": "Includes bibliographical references and index.\n\"IPFA '95 proceedings\"--Cover.\n\"IEEE catalog no. 95TH8113\"--Cover.\n\"27 November - 1 December 1995, Shangri-La Hotel, Singapore\"--Cover."}, "number_of_pages": 230, "lccn": ["95078165"], "isbn_10": ["0780327977", "0780327985"], "publish_date": "1995"}