{"languages": [{"key": "/l/eng"}], "physical_format": "Paperback", "subtitle": "Ats 2003", "last_modified": {"type": "/type/datetime", "value": "2008-04-29 15:03:11.581851"}, "publishers": ["Ieee"], "number_of_pages": 517, "id": 10934800, "isbn_13": ["9780769519517"], "isbn_10": ["0769519512"], "publish_date": "January 31, 2003", "key": "/b/OL8067650M", "authors": [{"key": "/a/OL2853890A"}], "title": "Proceedings 12th Asian Test Symposium", "type": {"key": "/type/edition"}, "subjects": ["Electronics engineering", "Computer Engineering", "Computers", "Computer Books: General"], "revision": 1}