Semiconductor Device Reliability (NATO Science Series E:)

Published in December 31, 1989, Springer

Semiconductor Device Reliability (NATO Science Series E:)

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Contributions:	A. Christou (Editor), B.A. Unger (Editor)
Language:	English
Edition:	1 edition
Format:	Hardcover
Dimensions:	9.1 x 5.9 x 1.2 inches
Weight:	2.2 pounds
ISBN 10:	0792305361
ISBN 13:	9780792305361
Subject:	Electronic devices & materials Science/Mathematics Semiconductors Technology Technology & Industrial Arts Electronics - Semiconductors Engineering - Electrical & Electronic Engineering - Industrial Technology / Electronics / Semiconductors Technology / Engineering / Electrical Technology-Engineering - Electrical & Electronic Technology-Engineering - Industrial Congresses Reliability