{"isbn_13": ["9780792305361"], "physical_format": "Hardcover", "weight": "2.2 pounds", "languages": [{"key": "/l/eng"}], "type": {"key": "/type/edition"}, "publishers": ["Springer"], "number_of_pages": 592, "id": 10603403, "edition_name": "1 edition", "isbn_10": ["0792305361"], "publish_date": "December 31, 1989", "key": "/b/OL7806181M", "last_modified": {"type": "/type/datetime", "value": "2008-04-29 15:03:11.581851"}, "title": "Semiconductor Device Reliability (NATO Science Series E:)", "contributions": ["A. Christou (Editor)", "B.A. Unger (Editor)"], "subjects": ["Electronic devices & materials", "Science/Mathematics", "Semiconductors", "Technology", "Technology & Industrial Arts", "Electronics - Semiconductors", "Engineering - Electrical & Electronic", "Engineering - Industrial", "Technology / Electronics / Semiconductors", "Technology / Engineering / Electrical", "Technology-Engineering - Electrical & Electronic", "Technology-Engineering - Industrial", "Congresses", "Reliability"], "physical_dimensions": "9.1 x 5.9 x 1.2 inches", "revision": 1}