Data Mining and Diagnosing IC Fails (Frontiers in Electronic Testing) (Open Library)

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Data Mining and Diagnosing IC Fails (Frontiers in Electronic Testing)

by Leendert M. Huisman
Published in June 21, 2005, Springer

Data Mining and Diagnosing IC Fails (Frontiers in Electronic Testing)
Leendert M. Huisman

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Source records: Amazon.com
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Language: English

ISBN 10: 0387249931

ISBN 13: 9780387249933

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First sentence: Diagnosis is the extraction of information from fail data.

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