{"publishers": ["Springer"], "source_records": ["amazon:0387249931:23:513317808:203439", "marc:marc_loc_updates/v36.i11.records.utf8:8642811:1085"], "created": {"type": "/type/datetime", "value": "2008-04-29T13:35:46.876380"}, "number_of_pages": 250, "isbn_13": ["9780387249933"], "languages": [{"key": "/l/eng"}], "authors": [{"key": "/a/OL2680212A"}], "isbn_10": ["0387249931"], "publish_date": "June 21, 2005", "key": "/b/OL7444741M", "last_modified": {"type": "/type/datetime", "value": "2009-05-05T16:50:38.789940"}, "title": "Data Mining and Diagnosing IC Fails (Frontiers in Electronic Testing)", "latest_revision": 2, "type": {"key": "/type/edition"}, "id": 10136532, "first_sentence": {"type": "/type/text", "value": "Diagnosis is the extraction of information from fail data."}, "revision": 2}